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GB/T 43894.1-2024 Evaluation of near-edge geometry of semiconductor wafers - Part 1: High radial second derivative method (ZDD) 半导体晶片近边缘几何形态评价-第1部分：高度径向二阶导数法（ZDD） - 英文版 |
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GB/T 2689.4-1981 Life test and acceleration life test--Optimal linear deflection-free--Evaluation of Weibull distributions 寿命试验和加速寿命试验的最好线性无偏估计法(用于威布尔分布) - 英文版 |
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GB/T 2689.3-1981 Life test and acceleration life test--Simple linear deflection-free--Evaluation ofWeibull distributions 寿命试验和加速寿命试验的简单线性无偏估计法(用于威布尔分布) - 英文版 |
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