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GB/T 14634.5-2010 Test methods of rare earth three-band phosphors for fluorescent lamps - Part 5: Determination of density 灯用稀土三基色荧光粉试验方法 第5部分：密度的测定 - 英文版 |
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GB/T 14634.3-2010 Test methods of rare earth three-band phosphors for fluorescent lamps - Part 3: Determination of thermostability 灯用稀土三基色荧光粉试验方法 第3部份：热稳定性的测定 - 英文版 |
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GB/T 14634.2-2010 Test methods of rare earth three-band phosphors for fluorescent lamps - Part 2: Determination of emission dominantpeak and chromaticity 灯用稀土三基色荧光粉试验方法 第2部分：发射主峰和色度性能的测定 - 英文版 |
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GB/T 14634.1-2010 Test methods of rare earth three-band phosphors for fluorescent lamps - Part 1: Determination of relative brightness 灯用稀土三基色荧光粉试验方法 第1部分：相对亮度的测定 - 英文版 |
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GB 24941-2010 Safety frames for low-speed goods vehicles - Requirements and test methods 低速货车安全架 要求和试验方法 - 英文版 |
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GB 24940-2010 Safety frames for tri-wheel vehicles - Requirements and test methods 三轮汽车安全架 要求和试验方法 - 英文版 |
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GB 24930-2010 Safety property requirements and test method for fuel tanks of all-terrain vehicles 全地形车燃油箱安全性能要求和试验方法 - 英文版 |
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GB/Z 24987-2010 Paper, board and pulps - Estimation of uncertainty for test methods 纸、纸板和纸浆 测试方法不确定度的评定 - 英文版 |
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GB/T 24985-2010 Test methods for reliability on household and similar room air conditioners 家用和类似用途房间空气调节器可靠性试验方法 - 英文版 |
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GB/T 24935-2010 The test method of maximum stable side-inclination for all-terrain vehicles 全地形车最大侧倾稳定角试验方法 - 英文版 |
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GB/T 9766.7-2009 Test method for tyre valves - Part 7: Components test methods 轮胎气门嘴试验方法 第7部分：零部件试验方法 - 英文版 |
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GB/T 9766.5-2009 Test method for tyre valve - Part 5: Tyre valves for large core chamber test methods 轮胎气门嘴试验方法 第5部分：大芯腔气门嘴试验方法 - 英文版 |
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GB/T 9766.4-2009 Test method for tyre valve - Part 4: Clamp-in tubeless valves test methods 轮胎气门嘴试验方法 第4部分：压紧式无内胎气门嘴试验方法 - 英文版 |
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GB/T 24688-2009 Equipment for animal disinfection machinery - Test methods 动物防疫消毒机 试验方法 - 英文版 |
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GB/T 24684.3-2009 Crop protection equipment - Test methods for the evaluation of cleaning systems - Part 3: Internal cleaning of tank 植物保护机械 评价清洗系统的试验方法 第3部分：药液箱的内部清洗 - 英文版 |
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GB/T 24684.2-2009 Crop protection equipment - Test methods for the evaluation of cleaning systems - Part 2：External cleaning of sprayers 植物保护机械 评价清洗系统的试验方法 第2部分：喷雾机的外部清洗 - 英文版 |
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GB/T 24684.1-2009 Crop protection equipment - Test methods for the evaluation of cleaning systems - Part 1：Internal cleaning of complete sprayers 植物保护机械 评价清洗系统的试验方法 第1部分：喷雾机整机的内部清洗 - 英文版 |
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GB/T 24683-2009 Equipment for crop protection - Test methods for air-assisted sprayers for bush and tree crops 植物保护机械 灌木和乔木作物用风送式喷雾机 试验方法 - 英文版 |
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GB/T 24679.1-2009 Equipment for crop protection - Knapsack sprayers - Part 1: requirements and test methods 植物保护机械 背负式喷雾器 第1部分：试验要求和方法 - 英文版 |
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GB/T 16311-2009 Specification and test method for road traffic markings 道路交通标线质量要求和检测方法 - 英文版 |
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GB/T 24644-2009 Testing method and performance requirement of falling object protective - Structures on agricultural and forestry tractors 农林拖拉机落物防护装置 试验方法和性能要求 - 英文版 |
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GB/T 14710-2009 The environmental requirement and test methods for medical electrical equipment 医用电器环境要求及试验方法 - 英文版 |
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GB/T 5909-2009 Performance requirements and test methods of commercial vehicles wheels 商用车辆车轮性能要求和试验方法 - 英文版 |
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GB/T 4970-2009 Method of running test - Automotive ride comfort 汽车平顺性试验方法 - 英文版 |
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GB/T 24554-2009 Performance test methods for fuel cell engines 燃料电池发动机性能试验方法 - 英文版 |
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GB/T 24552-2009 Electric vehicles - Windshield demisters and defrosters system - Performance requirements and test methods 电动汽车风窗玻璃除霜除雾系统的性能要求及试验方法 - 英文版 |
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GB/T 6621-2009 Testing methods for surface flatness of silicon slices 硅片表面平整度测试方法 - 英文版 |
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GB/T 6620-2009 Test method for measuring warp on silicon slices by noncontact scanning 硅片翘曲度非接触式测试方法 - 英文版 |
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GB/T 6619-2009 Test methods for bow of silicon wafers 硅片弯曲度测试方法 - 英文版 |
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GB/T 6618-2009 Test method for thickness and total thickness variation of silicon slices 硅片厚度和总厚度变化测试方法 - 英文版 |
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GB/T 6617-2009 Test method for measuring resistivity of silicon wafer using spreading resistance probe 硅片电阻率测定 扩展电阻探针法 - 英文版 |
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GB/T 6616-2009 Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge 半导体硅片电阻率及硅薄膜薄层电阻测试方法 非接触涡流法 - 英文版 |
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GB/T 4058-2009 Test method for detection of oxidation induced defects in polished silicon wafers 硅抛光片氧化诱生缺陷的检验方法 - 英文版 |
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GB/T 24578-2009 Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy 硅片表面金属沾污的全反射X光荧光光谱测试方法 - 英文版 |
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GB/T 24577-2009 Test methods for analyzing organic contaminants on silicon wafer surfaces by thermal desorption gas chromatography 热解吸气相色谱法测定硅片表面的有机污染物 - 英文版 |
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GB/T 24576-2009 Test method for measuring the Al fraction in AlGaAs on GaAs substrates by high resolution X-ray diffraction 高分辩率X射线衍射测量GaAs衬底生长的AlGaAs中Al成分的试验方法 - 英文版 |
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GB/T 24575-2009 Test method for measuring surface sodium,aluminum,potassium,and iron on silicon and epi substrates by secondary ion mass spectrometry 硅和外延片表面Na、Al、K和Fe的二次离子质谱检测方法 - 英文版 |
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GB/T 24574-2009 Test methods for photoluminescence analysis of single crystal silicon for III-V impurities 硅单晶中Ⅲ-Ⅴ族杂质的光致发光测试方法 - 英文版 |
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GB/T 24490-2009 Test method for purity of multi-walled carbon nanotubes 多壁碳纳米管纯度的测量方法 - 英文版 |
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GB/T 24488-2009 Test method for electrochemical properties of magnesium alloys sacrificial anode 镁合金牺牲阳极电化学性能测试方法 - 英文版 |
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GB/T 24582-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry 酸浸取 电感耦合等离子质谱仪测定多晶硅表面金属杂质 - 英文版 |
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GB/T 24581-2009 Test method for low temperature FT-IR analysis of single crystal silicon for Ⅲ-Ⅴ impurities 低温傅立叶变换红外光谱法测量硅单晶中III、V族杂质含量的测试方法 - 英文版 |
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GB/T 24580-2009 Test method for measuring boron contamination in heavily doped n-type silicon substrates by secondary ion mass spectrometry 重掺n型硅衬底中硼沾污的二次离子质谱检测方法 - 英文版 |
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GB/T 24579-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy 酸浸取 原子吸收光谱法测定多晶硅表面金属污染物 - 英文版 |
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GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal 半导体单晶晶向测定方法 - 英文版 |
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GB/T 1554-2009 Testing method for crystallographic perfection of silicon by preferential etch techniques 硅晶体完整性化学择优腐蚀检验方法 - 英文版 |
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GB/T 1553-2009 Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay 硅和锗体内少数载流子寿命测定光电导衰减法 - 英文版 |
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GB/T 1551-2009 Test method for measuring resistivity of monocrystal silicon 硅单晶电阻率测定方法 - 英文版 |
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GB/T 14144-2009 Testing method for determination of radial interstitial oxygen variation in silicon 硅晶体中间隙氧含量径向变化测量方法 - 英文版 |
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GB/T 14141-2009 Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array 硅外延层、扩散层和离子注入层薄层电阻的测定 直排四探针法 - 英文版 |
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