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GB/T 22586-2018 Electronic characteristic measurements—Surface resistance of superconductors at microwave frequencies 电子学特性测量 超导体在微波频率下的表面电阻 - 英文版 |
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GB/T 34894-2017 Micro-electromechanical system technology—Measuring method for strain gradient measurements of MEMS microstructures using an optical interferometer 微机电系统（MEMS）技术 基于光学干涉的MEMS微结构应变梯度测量方法 - 英文版 |
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GB/T 34900-2017 Micro-electromechanical system technology—Measuring method for residual strain measurements of MEMS microstructures using an optical interferometer 微机电系统（MEMS）技术 基于光学干涉的MEMS微结构残余应变测量方法 - 英文版 |
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GB/T 34893-2017 Micro-electromechanical system technology—Measuring method for in-plane length measurements of MEMS microstructures using an optical interferometer 微机电系统（MEMS）技术 基于光学干涉的MEMS微结构面内长度测量方法 - 英文版 |
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GB/T 22586-2008 Measurements of microwave surface resistance of resistance of HTSC thin film 高温超导薄膜微波表面电阻测试 - 英文版 |
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