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GB/T 26068-2018
Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method
硅片和硅锭载流子复合寿命的测试-非接触微波反射光电导衰减法 - 英文版
GB/T 37131-2018
Nanotechnologies—Test method of semiconductor nanopowder using UV-Vis diffuse reflectance spectroscopy
纳米技术-半导体纳米粉体材料紫外-可见漫反射光谱的测试方法 - 英文版
GB/T 33234-2016
Reflectance test method of reflective glass mirror for concentrated solar power system
光热发电玻璃反射镜反射比测试方法 - 英文版
GB/T 26068-2010
Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance
硅片载流子复合寿命的无接触微波反射光电导衰减测试方法 - 英文版
GB/T 16850.5-2001
Basic specification for optical fibre amplifier test methods--Part 5:Test methods for reflectance parameters
光纤放大器试验方法基本规范 第5部分:反射参数的试验方法 - 英文版

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