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	GB/T 28893-2024 Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-methods for determining peak intensity and information required for reporting results 表面化学分析-俄歇电子能谱和X射线光电子能谱-测定峰强度的方法和报告结果所需的信息 - 英文版
	GB/T 28892-2024 Surface chemical analysis-X-ray photoelectron spectroscopy-selected instrument performance parameter statements 表面化学分析-X射线光电子能谱-选择仪器性能参数的表述 - 英文版
	GB/T 43663-2024 Surface chemical analysis - Secondary ion mass spectrometry - Repeatability and consistency of relative intensity standards of static secondary ion mass spectrometry 表面化学分析-二次离子质谱-静态二次离子质谱相对强度标的重复性和一致性 - 英文版
	GB/T 43661-2024 Surface chemical analysis - Scanning probe microscopy - Definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPM, such as SSRM and SCM) for two-dimensional imaging of dopants, etc. 表面化学分析-扫描探针显微术-用于二维掺杂物成像等用途的电扫描探针显微镜（ESPM，如SSRM和SCM）空间分辨的定义和校准 - 英文版
	GB/T 19502-2023 Surface chemical analysis—General principles for glow discharge emission spectroscopy methods 表面化学分析辉光放电发射光谱方法通则 - 英文版
	GB/T 6609.35-2023 Methods for chemical analysis and determination of physical properties of alumina Part 35: Determination of specific surface area Nitrogen adsorption method 氧化铝化学分析方法和物理性能测定方法第35部分：比表面积的测定氮吸附法 - 英文版
	GB/T 42659-2023 Surface chemical analysis Scanning probe microscopy Determination of geometric quantities using scanning probe microscopy: Calibration of measurement systems 表面化学分析扫描探针显微术采用扫描探针显微镜测定几何量：测量系统校准 - 英文版
	GB/T 42658.4-2023 Surface chemical analysis Sample Handling, Preparation and Setup Guide Part 4: Reporting information on the origin, preparation, handling and set-up of nanoobjects prior to surface analysis 表面化学分析样品处理、制备和安装指南第4部分: 报告表面分析前纳米物体相关的来历、制备、处理和安装信息 - 英文版
	GB/T 22461.1-2023 Surface chemical analysis Glossary Part 1: General and spectroscopic terminology 表面化学分析词汇第1部分：通用术语及谱学术语 - 英文版
	GB/T 42543-2023 Surface chemical analysis Scanning Probe Microscopy Determination of the Normal Elastic Constant of a Cantilever Beam 表面化学分析扫描探针显微术悬臂梁法向弹性常数的测定 - 英文版
	GB/T 22461.2-2023 Surface chemical analysis - Vocabulary Part 2: Scanning probe microscopy terminology 表面化学分析词汇第2部分：扫描探针显微术术语 - 英文版
	GB/T 42360-2023 Surface chemical analysis Total Reflection X-ray Fluorescence Spectroscopy of Water 表面化学分析水的全反射X射线荧光光谱分析 - 英文版
	GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer 表面化学分析二次离子质谱飞行时间二次离子质谱仪质量标校准 - 英文版
	GB/T 40128-2021 Surface chemical analysis—Atomic force microscopy—Test method for thickness of the two-dimensional layered molybdenum disulfide nanosheets 表面化学分析原子力显微术二硫化钼片层材料厚度测量方法 - 英文版
	GB/T 40110-2021 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy 表面化学分析全反射X射线荧光光谱法（TXRF）测定硅片表面元素污染 - 英文版
	GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon 表面化学分析二次离子质谱硅中硼深度剖析方法 - 英文版
	GB/T 41073-2021 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy 表面化学分析电子能谱 X射线光电子能谱峰拟合报告的基本要求 - 英文版
	GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis 表面化学分析中等分辨俄歇电子能谱仪元素分析用能量标校准 - 英文版
	GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films 表面化学分析深度剖析用单层和多层薄膜测定X射线光电子能谱、俄歇电子能谱和二次离子质谱中深度剖析溅射速率的方法 - 英文版
	GB/T 41072-2021 Surface chemical analysis -- Electron spectroscopies -- Guidelines for ultraviolet photoelectron spectroscopy analysis 表面化学分析电子能谱紫外光电子能谱分析指南 - 英文版
	GB/T 39527-2020 Determination of calcium, aluminium and silicon in the solid surface materials—Method of chemical analysis 实体面材产品中钙、铝、硅元素含量的测定化学分析法 - 英文版
	GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy 表面化学分析扫描探针显微镜数据传送格式 - 英文版
	GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis 表面化学分析 X射线光电子能谱薄膜分析结果的报告 - 英文版
	GB/T 34326-2017 Surface chemical analysis—Depth profiling—Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS 表面化学分析深度剖析 AES和XPS深度剖析时离子束对准方法及其束流或束流密度测量方法 - 英文版
	GB/T 34174-2017 Surface chemical analysis—Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation 表面化学分析工作参考物质中离子注入产生的驻留面剂量定值的推荐程序 - 英文版
	GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales 表面化学分析 X射线光电子能谱仪能量标尺的校准 - 英文版
	GB/T 33502-2017 Surface chemical analysis—Recording and reporting data in X-ray photoelectron spectroscopy（XPS）表面化学分析 X射线光电子能谱（XPS）数据记录与报告的规范要求 - 英文版
	GB/T 33498-2017 Surface chemical analysis—Characterization of nanostructured materials 表面化学分析纳米结构材料表征 - 英文版
	GB/T 32998-2016 Surface chemical analysis—Auger electron spectroscopy—Reporting of methods used for charge control and charge correction 表面化学分析俄歇电子能谱荷电控制与校正方法报告的规范要求 - 英文版
	GB/T 32997-2016 Surface chemical analysis—General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry 表面化学分析辉光放电发射光谱定量成分深度剖析的通用规程 - 英文版
	GB/T 32999-2016 Surface chemical analysis—Depth profiling—Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer 表面化学分析深度剖析用机械轮廓仪栅网复型法测量溅射速率 - 英文版
	GB/T 32996-2016 Surface chemical analysis—Analysis of metal oxide films by glow-discharge optical emission spectrometry 表面化学分析辉光放电发射光谱法分析金属氧化物膜 - 英文版
	GB/Z 32494-2016 Surface chemical analysis—Auger electron spectroscopy—Derivation of chemical information 表面化学分析俄歇电子能谱化学信息的解析 - 英文版
	GB/Z 32490-2016 Surface chemical analysis—X-ray photoelectron spectroscopy—Procedures for determining backgrounds 表面化学分析 X射线光电子能谱确定本底的程序 - 英文版
	GB/T 32565-2016 Surface chemical analysis—Recording and reporting data in Auger electron spectroscopy (AES) 表面化学分析俄歇电子能谱（AES）数据记录与报告的规范要求 - 英文版
	GB/T 32495-2016 Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of arsenic in silicon 表面化学分析二次离子质谱硅中砷的深度剖析方法 - 英文版
	GB/T 30815-2014 Surface chemical analysis―Guidelines for preparation and mounting of specimens for analysis 表面化学分析分析样品的制备和安装方法指南 - 英文版
	GB/T 30704-2014 Surface chemical analysis―X-ray photoelectron spectroscopy―Guidelines for analysis 表面化学分析 X射线光电子能谱分析指南 - 英文版
	GB/T 30702-2014 Surface chemical analysis―Auger electron spectroscopy and X-ray photoelectron spectroscopy―Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials 表面化学分析俄歇电子能谱和X射线光电子能谱实验测定的相对灵敏度因子在均匀材料定量分析中的使用指南 - 英文版
	GB/T 30701-2014 Surface chemical analysis―Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy 表面化学分析硅片工作标准样品表面元素的化学收集方法和全反射X射线荧光光谱法(TXRF)测定 - 英文版
	GB/T 29732-2013 Surface chemical analysis - Medium resolution auger electron spectrometers - Calibration of energy scales for elemental analysis 表面化学分析中等分辨率俄歇电子谱仪元素分析用能量标校准 - 英文版
	GB/T 29731-2013 Surface chemical analysis - High resolution auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis 表面化学分析高分辨俄歇电子能谱仪元素和化学态分析用能量标校准 - 英文版
	GB/T 29559-2013 Surface chemical analysis - Analysis of zinc and/or aluminium based metallic coatings by glow discharge optical emission spectrometry 表面化学分析辉光放电原子发射光谱锌和/或铝基合金镀层的分析 - 英文版
	GB/T 29558-2013 Surface chemical analysis - Auger electron spectroscopy - Repeatability and constancy of intensity scale 表面化学分析俄歇电子能谱强度标的重复性和一致性 - 英文版
	GB/T 29557-2013 Surface chemical analysis - Depth profiling - Measurment of sputtered depth 表面化学分析深度剖析溅射深度测量 - 英文版
	GB/T 29556-2013 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - determination of lateral resolution, analysis area, and sample area viewed by the analyser 表面化学分析俄歇电子能谱和X射线光电子能谱横向分辨率、分析面积和分析器所能检测到的样品面积的测定 - 英文版
	GB/T 28894-2012 Surface chemical analysis - Handling of specimens prior to analysis 表面化学分析分析前样品的处理 - 英文版
	GB/T 28893-2012 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results 表面化学分析俄歇电子能谱和X射线光电子能谱测定峰强度的方法和报告结果所需的信息 - 英文版
	GB/T 28892-2012 Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters 表面化学分析 X射线光电子能谱选择仪器性能参数的表述 - 英文版
	GB/T 28633-2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale 表面化学分析 X射线光电子能谱强度标的重复性和一致性 - 英文版

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