China Wafer level test met GB Standards Search Result |
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1. Ready translated GB standards  and Chinese version GB Standards, you can purchase directly in the web page; After receive your payment, we will send the GB Standards PDF file to your Email within
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2. Other English version GB Standards are not ready translated, only after get your order, then we translate them, time usually need 3-5 days . |
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GB/T 33922-2017 Wafer level test methods for MEMS piezoresistive pressure-sensitive die performances MEMS压阻式压力敏感芯片性能的圆片级试验方法 - 英文版 |
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GB/T 33657-2017 Nanotechnologies—Electrical operating parameter test specification of wafer level nano-scale phase change memory cells 纳米技术 晶圆级纳米尺度相变存储单元电学操作参数测试规范 - 英文版 |
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