GB/T 32189-2015 standards english version

NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA

GB/T 32189-2015

Test method for surface roughness of GaN single crystal substrate by atomic force microscope

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The Standardization Administration of the People's Republic of China

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GB Standard Code	GB/T 32189-2015
Standard Category	China National Standards
GB Standard English Title	Test method for surface roughness of GaN single crystal substrate by atomic force microscope
GB Standard Chinese Title	氮化镓单晶衬底表面粗糙度的原子力显微镜检验法
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