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GB/T 42902-2023 standards english version


NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA

GB/T 42902-2023

 

Testing of surface defects of silicon carbide epitaxial wafers Laser scattering method

 
Issued Date:  

Implemented Date:

Issued by:   The Standardization Administration of the People's Republic of China
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GB Standard Code GB/T 42902-2023
Standard Category China National Standards
GB Standard English Title Testing of surface defects of silicon carbide epitaxial wafers Laser scattering method
GB Standard Chinese Title 碳化硅外延片表面缺陷的测试 激光散射法
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