GB/T 6617-2009 standards english version

NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA

GB/T 6617-2009

Test method for measuring resistivity of silicon wafer using spreading resistance probe

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The Standardization Administration of the People's Republic of China

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GB Standard Code	GB/T 6617-2009
Standard Category	China National Standards
GB Standard English Title	Test method for measuring resistivity of silicon wafer using spreading resistance probe
GB Standard Chinese Title	硅片电阻率测定扩展电阻探针法
Chinese Version Price	$5.00 per page
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