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GB/T 6150.16-2009 Methods for chemical analysis of tungsten concentrates - Determination of iron content - The sulfosalicylic acid spectrophotometry 钨精矿化学分析方法 铁量的测定 磺基水杨酸分光光度法 - 英文版 |
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GB/T 5238-2009 Monocrystalline germanium and monocrystalline germanium slices 锗单晶和锗单晶片 - 英文版 |
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GB/T 4061-2009 Polycrystalline silicon-examination method-assessment of sandwiches on cross-section by chemical corrosion 硅多晶断面夹层化学腐蚀检验方法 - 英文版 |
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GB/T 4058-2009 Test method for detection of oxidation induced defects in polished silicon wafers 硅抛光片氧化诱生缺陷的检验方法 - 英文版 |
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GB/T 3394-2009 Ethylene and propylene for industrial use - Determination of trace carbon monoxide, carbon dioxide and acetylene - Gas chromatographic method 工业用乙烯、丙烯中微量一氧化碳、二氧化碳和乙炔的测定 气相色谱法 - 英文版 |
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GB/T 3393-2009 Ethylene and propylene for industrial use - Determination of trace hydrogen - Gas chromatographic method 工业用乙烯、丙烯中微量氢的测定 气相色谱法 - 英文版 |
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GB/T 24578-2009 Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy 硅片表面金属沾污的全反射X光荧光光谱测试方法 - 英文版 |
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GB/T 24577-2009 Test methods for analyzing organic contaminants on silicon wafer surfaces by thermal desorption gas chromatography 热解吸气相色谱法测定硅片表面的有机污染物 - 英文版 |
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GB/T 24576-2009 Test method for measuring the Al fraction in AlGaAs on GaAs substrates by high resolution X-ray diffraction 高分辩率X射线衍射测量GaAs衬底生长的AlGaAs中Al成分的试验方法 - 英文版 |
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GB/T 24575-2009 Test method for measuring surface sodium,aluminum,potassium,and iron on silicon and epi substrates by secondary ion mass spectrometry 硅和外延片表面Na、Al、K和Fe的二次离子质谱检测方法 - 英文版 |
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GB/T 24574-2009 Test methods for photoluminescence analysis of single crystal silicon for III-V impurities 硅单晶中Ⅲ-Ⅴ族杂质的光致发光测试方法 - 英文版 |
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GB/T 24491-2009 Multi-walled carbon nanotubes 多壁碳纳米管 - 英文版 |
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GB/T 24490-2009 Test method for purity of multi-walled carbon nanotubes 多壁碳纳米管纯度的测量方法 - 英文版 |
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GB/T 24488-2009 Test method for electrochemical properties of magnesium alloys sacrificial anode 镁合金牺牲阳极电化学性能测试方法 - 英文版 |
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GB/T 24487-2009 Alumina 氧化铝 - 英文版 |
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GB/T 24486-2009 Aluminium alloy wires for cable braiding 线缆编织用铝合金线 - 英文版 |
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GB/T 24485-2009 Niobium carbide powder 碳化铌粉 - 英文版 |
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GB/T 24484-2009 Sampling and preparation of the ferromolybdenum samples 钼铁试样的采取和制备方法 - 英文版 |
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GB/T 24483-2009 Bauxite 铝土矿石 - 英文版 |
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GB/T 24482-2009 Roasted molybdenum concentrate 焙烧钼精矿 - 英文版 |
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GB/T 24481-2009 Magnesium alloys sheets for 3C products 3C产品用镁合金薄板 - 英文版 |
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GB/T 24582-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry 酸浸取 电感耦合等离子质谱仪测定多晶硅表面金属杂质 - 英文版 |
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GB/T 24581-2009 Test method for low temperature FT-IR analysis of single crystal silicon for Ⅲ-Ⅴ impurities 低温傅立叶变换红外光谱法测量硅单晶中III、V族杂质含量的测试方法 - 英文版 |
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GB/T 24580-2009 Test method for measuring boron contamination in heavily doped n-type silicon substrates by secondary ion mass spectrometry 重掺n型硅衬底中硼沾污的二次离子质谱检测方法 - 英文版 |
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GB/T 24579-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy 酸浸取 原子吸收光谱法测定多晶硅表面金属污染物 - 英文版 |
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GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal 半导体单晶晶向测定方法 - 英文版 |
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GB/T 1554-2009 Testing method for crystallographic perfection of silicon by preferential etch techniques 硅晶体完整性化学择优腐蚀检验方法 - 英文版 |
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GB/T 1553-2009 Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay 硅和锗体内少数载流子寿命测定光电导衰减法 - 英文版 |
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GB/T 1551-2009 Test method for measuring resistivity of monocrystal silicon 硅单晶电阻率测定方法 - 英文版 |
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GB/T 14264-2009 Semiconductor materials-terms and definitions 半导体材料术语 - 英文版 |
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GB/T 14146-2009 Silicon epitaxial layers-determination of carrier concentration-mercury probe voltages-capacitance method 硅外延层载流子浓度测定 汞探针电容-电压法 - 英文版 |
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GB/T 14144-2009 Testing method for determination of radial interstitial oxygen variation in silicon 硅晶体中间隙氧含量径向变化测量方法 - 英文版 |
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GB/T 14141-2009 Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array 硅外延层、扩散层和离子注入层薄层电阻的测定 直排四探针法 - 英文版 |
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GB/T 14140-2009 Test method for measuring diameter of semiconductor wafer 硅片直径测量方法 - 英文版 |
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GB/T 14139-2009 Silicon epitaxial wafers 硅外延片 - 英文版 |
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GB/T 13388-2009 Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques 硅片参考面结晶学取向X射线测试方法 - 英文版 |
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GB/T 13387-2009 Test method for measuring flat length wafers of silicon and other electronic materials 硅及其它电子材料晶片参考面长度测量方法 - 英文版 |
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GB/T 11072-2009 Indium antimonide polycrystal,single crystals and as-cut slices 锑化铟多晶、单晶及切割片 - 英文版 |
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GB/T 1558-2009 Test method for substitutional atomic carbon concent of silicon by infrared absorption 硅中代位碳原子含量 红外吸收测量方法 - 英文版 |
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GB/T 10118-2009 High purity gallium 高纯镓 - 英文版 |
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GB/T 10117-2009 High purity antimonium 高纯锑 - 英文版 |
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GB 24568-2009 Calcium hydrogen phosphate for tooth-paste industry 牙膏工业用磷酸氢钙 - 英文版 |
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GB 24567-2009 Sodium monofluorophosphate for tooth-paste industry 牙膏工业用单氟磷酸钠 - 英文版 |
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GB 24512.2-2009 Seamless steel tubes and pipes for nuclear power plant - Part 2: Alloy steel seamless tubes and pipes 核电站用无缝钢管 第2部分：合金钢无缝钢管 - 英文版 |
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GB 24512.1-2009 Seamless steel tubes and pipes for nuclear power plant - Part 1: Carbon steel seamless tubes and pipes 核电站用无缝钢管 第1部分：碳素钢无缝钢管 - 英文版 |
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GB 24511-2009 Stainless steel plate, sheet and strip for pressure equipments 承压设备用不锈钢钢板及钢带 - 英文版 |
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GB 24510-2009 9%Nickel steel plates for pressure vessels with specified low temperature properties 低温压力容器用9％Ni钢板 - 英文版 |
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GB/T 9941-2009 High speed tool steel sheets and plates 高速工具钢钢板 - 英文版 |
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GB/T 8037-2009 Benzol products of coal carbonization - Test for presence of mercap tans 焦化苯类产品中硫醇的检验方法 - 英文版 |
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GB/T 8036-2009 Benzol products of coal carbonization - Determination of color 焦化苯类产品颜色的测定方法 - 英文版 |
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