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GB/T 6150.16-2009
Methods for chemical analysis of tungsten concentrates - Determination of iron content - The sulfosalicylic acid spectrophotometry
钨精矿化学分析方法 铁量的测定 磺基水杨酸分光光度法 - 英文版
GB/T 5238-2009
Monocrystalline germanium and monocrystalline germanium slices
锗单晶和锗单晶片 - 英文版
GB/T 4061-2009
Polycrystalline silicon-examination method-assessment of sandwiches on cross-section by chemical corrosion
硅多晶断面夹层化学腐蚀检验方法 - 英文版
GB/T 4058-2009
Test method for detection of oxidation induced defects in polished silicon wafers
硅抛光片氧化诱生缺陷的检验方法 - 英文版
GB/T 3394-2009
Ethylene and propylene for industrial use - Determination of trace carbon monoxide, carbon dioxide and acetylene - Gas chromatographic method
工业用乙烯、丙烯中微量一氧化碳、二氧化碳和乙炔的测定 气相色谱法 - 英文版
GB/T 3393-2009
Ethylene and propylene for industrial use - Determination of trace hydrogen - Gas chromatographic method
工业用乙烯、丙烯中微量氢的测定 气相色谱法 - 英文版
GB/T 24578-2009
Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy
硅片表面金属沾污的全反射X光荧光光谱测试方法 - 英文版
GB/T 24577-2009
Test methods for analyzing organic contaminants on silicon wafer surfaces by thermal desorption gas chromatography
热解吸气相色谱法测定硅片表面的有机污染物 - 英文版
GB/T 24576-2009
Test method for measuring the Al fraction in AlGaAs on GaAs substrates by high resolution X-ray diffraction
高分辩率X射线衍射测量GaAs衬底生长的AlGaAs中Al成分的试验方法 - 英文版
GB/T 24575-2009
Test method for measuring surface sodium,aluminum,potassium,and iron on silicon and epi substrates by secondary ion mass spectrometry
硅和外延片表面Na、Al、K和Fe的二次离子质谱检测方法 - 英文版
GB/T 24574-2009
Test methods for photoluminescence analysis of single crystal silicon for III-V impurities
硅单晶中Ⅲ-Ⅴ族杂质的光致发光测试方法 - 英文版
GB/T 24491-2009
Multi-walled carbon nanotubes
多壁碳纳米管 - 英文版
GB/T 24490-2009
Test method for purity of multi-walled carbon nanotubes
多壁碳纳米管纯度的测量方法 - 英文版
GB/T 24488-2009
Test method for electrochemical properties of magnesium alloys sacrificial anode
镁合金牺牲阳极电化学性能测试方法 - 英文版
GB/T 24487-2009
Alumina
氧化铝 - 英文版
GB/T 24486-2009
Aluminium alloy wires for cable braiding
线缆编织用铝合金线 - 英文版
GB/T 24485-2009
Niobium carbide powder
碳化铌粉 - 英文版
GB/T 24484-2009
Sampling and preparation of the ferromolybdenum samples
钼铁试样的采取和制备方法 - 英文版
GB/T 24483-2009
Bauxite
铝土矿石 - 英文版
GB/T 24482-2009
Roasted molybdenum concentrate
焙烧钼精矿 - 英文版
GB/T 24481-2009
Magnesium alloys sheets for 3C products
3C产品用镁合金薄板 - 英文版
GB/T 24582-2009
Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry
酸浸取 电感耦合等离子质谱仪测定多晶硅表面金属杂质 - 英文版
GB/T 24581-2009
Test method for low temperature FT-IR analysis of single crystal silicon for Ⅲ-Ⅴ impurities
低温傅立叶变换红外光谱法测量硅单晶中III、V族杂质含量的测试方法 - 英文版
GB/T 24580-2009
Test method for measuring boron contamination in heavily doped n-type silicon substrates by secondary ion mass spectrometry
重掺n型硅衬底中硼沾污的二次离子质谱检测方法 - 英文版
GB/T 24579-2009
Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy
酸浸取 原子吸收光谱法测定多晶硅表面金属污染物 - 英文版
GB/T 1555-2009
Testing methods for determining the orientation of a semiconductor single crystal
半导体单晶晶向测定方法 - 英文版
GB/T 1554-2009
Testing method for crystallographic perfection of silicon by preferential etch techniques
硅晶体完整性化学择优腐蚀检验方法 - 英文版
GB/T 1553-2009
Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay
硅和锗体内少数载流子寿命测定光电导衰减法 - 英文版
GB/T 1551-2009
Test method for measuring resistivity of monocrystal silicon
硅单晶电阻率测定方法 - 英文版
GB/T 14264-2009
Semiconductor materials-terms and definitions
半导体材料术语 - 英文版
GB/T 14146-2009
Silicon epitaxial layers-determination of carrier concentration-mercury probe voltages-capacitance method
硅外延层载流子浓度测定 汞探针电容-电压法 - 英文版
GB/T 14144-2009
Testing method for determination of radial interstitial oxygen variation in silicon
硅晶体中间隙氧含量径向变化测量方法 - 英文版
GB/T 14141-2009
Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array
硅外延层、扩散层和离子注入层薄层电阻的测定 直排四探针法 - 英文版
GB/T 14140-2009
Test method for measuring diameter of semiconductor wafer
硅片直径测量方法 - 英文版
GB/T 14139-2009
Silicon epitaxial wafers
硅外延片 - 英文版
GB/T 13388-2009
Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques
硅片参考面结晶学取向X射线测试方法 - 英文版
GB/T 13387-2009
Test method for measuring flat length wafers of silicon and other electronic materials
硅及其它电子材料晶片参考面长度测量方法 - 英文版
GB/T 11072-2009
Indium antimonide polycrystal,single crystals and as-cut slices
锑化铟多晶、单晶及切割片 - 英文版
GB/T 1558-2009
Test method for substitutional atomic carbon concent of silicon by infrared absorption
硅中代位碳原子含量 红外吸收测量方法 - 英文版
GB/T 10118-2009
High purity gallium
高纯镓 - 英文版
GB/T 10117-2009
High purity antimonium
高纯锑 - 英文版
GB 24568-2009
Calcium hydrogen phosphate for tooth-paste industry
牙膏工业用磷酸氢钙 - 英文版
GB 24567-2009
Sodium monofluorophosphate for tooth-paste industry
牙膏工业用单氟磷酸钠 - 英文版
GB 24512.2-2009
Seamless steel tubes and pipes for nuclear power plant - Part 2: Alloy steel seamless tubes and pipes
核电站用无缝钢管 第2部分:合金钢无缝钢管 - 英文版
GB 24512.1-2009
Seamless steel tubes and pipes for nuclear power plant - Part 1: Carbon steel seamless tubes and pipes
核电站用无缝钢管 第1部分:碳素钢无缝钢管 - 英文版
GB 24511-2009
Stainless steel plate, sheet and strip for pressure equipments
承压设备用不锈钢钢板及钢带 - 英文版
GB 24510-2009
9%Nickel steel plates for pressure vessels with specified low temperature properties
低温压力容器用9%Ni钢板 - 英文版
GB/T 9941-2009
High speed tool steel sheets and plates
高速工具钢钢板 - 英文版
GB/T 8037-2009
Benzol products of coal carbonization - Test for presence of mercap tans
焦化苯类产品中硫醇的检验方法 - 英文版
GB/T 8036-2009
Benzol products of coal carbonization - Determination of color
焦化苯类产品颜色的测定方法 - 英文版

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